Quality and Reliability Assessment of Electrical Units in Accelerated Life Testing via Bayesian Statistical Approach
Document Type
Article
Publication Date
Winter 1-12-2025
Abstract
This study discusses predicting the survival times of some electrical units over future time subjected to an accelerated life test (ALT), namely the step stress ALT. Due to the longevity of the tested units, a censoring scheme is applied, namely the type I censoring scheme, to limit the time of the applied test. The main theme of this paper is to assess the quality of the tested items, based on Bayesian estimation, to guarantee that these units are more reliable and can compete in the world markets.
Recommended Citation
Mansour, Mahmoud and Mohamed, Nagwa Dr, "Quality and Reliability Assessment of Electrical Units in Accelerated Life Testing via Bayesian Statistical Approach" (2025). Basic Science Engineering. 151.
https://buescholar.bue.edu.eg/basic_sci_eng/151